buchspektrum Internet-Buchhandlung

Neuerscheinungen 2010

Stand: 2020-01-07
Schnellsuche
ISBN/Stichwort/Autor
Herderstraße 10
10625 Berlin
Tel.: 030 315 714 16
Fax 030 315 714 14
info@buchspektrum.de

Patrick Huff

CRESST-II Dark Matter Experiment


The Detector Parameters Determining the Sensitivity of the CRESST-II Experiment
2010. 172 S. 220 mm
Verlag/Jahr: SÜDWESTDEUTSCHER VERLAG FÜR HOCHSCHULSCHRIFTEN 2010
ISBN: 3-8381-1620-8 (3838116208)
Neue ISBN: 978-3-8381-1620-4 (9783838116204)

Preis und Lieferzeit: Bitte klicken


One of the most important open questions in modern physics is the riddle of the nature of Dark Matter. Observations, e.g. galactic rotation curves, show that about a quarter of the mass in the universe is in form of Dark Matter. These, up to now only indirect, observations are the main motivation for direct Dark Matter search experiments as CRESST-II, which aim to identify the nature of Dark Matter. CRESST-II is searching directly for Dark Matter in the form of hypothetical WIMPs. Within the framework of this work the functional principles of the CRESST-II detector modules are analyzed and discussed. Therefor the parameters have been identified which determine their sensitivity and the understanding of their behavior has been developed in detail.
Patrick Huff, born in 1980, studied general physics at theTechnische University of Munich (TUM), Germany. Afterwards he didhis PhD in the field of astroparticle physics at theMax-Planck-Institute of Physics in Munich, Germany.