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Abdelkhalak El Hami, Abdelkhalak El Hami, Philippe Pougnet (Beteiligte)

Embedded Mechatronic Systems


Analysis of Failures, Predictive Reliability
Herausgegeben von Hami, Abdelkhalak El; Pougnet, Philippe
2015. 262 p. 229 mm
Verlag/Jahr: ELSEVIER BOOKS 2015
ISBN: 1-78548-013-8 (1785480138)
Neue ISBN: 978-1-78548-013-3 (9781785480133)

Preis und Lieferzeit: Bitte klicken


In operation, mechatronics embedded systems are stressed by loads of different causes: climate (temperature, humidity), vibration, electrical and electromagnetic. These stresses in components which induce failure mechanisms should be identified and modeled for better control. AUDACE is a collaborative project of the cluster Mov´eo that address issues specific to mechatronic reliability embedded systems. AUDACE means analyzing the causes of failure of components of mechatronic systems onboard. The goal of the project is to optimize the design of mechatronic devices by reliability.

The project brings together public sector laboratories that have expertise in analysis and modeling of failure, major groups of mechatronics (Valeo and Thales) in the automotive and aerospace and small and medium enterprises that have skills in characterization and validation tests

Find and develop ways to characterize and validate the design robustness and reliability of complex mechatronic devices
Develop ways to characterize physical and chemical phenomena
Identify mechanisms of failure of components of these devices
Analyze the physical and chemical mechanisms of failure, in order of importance
Model failure mechanisms and design optimization
1. Predictive Reliability of Embedded Electronic Systems
2. Measuring Method of the Internal Temperature of Electronic Components
3. Dynamic Analysis of Mechatronic Components by Laser Vibrometry
4. Measurement of Static and Vibratory Deformations and Displacements by Full Field Methods
5. Characterization of the Electromagnetic Environment of Microwave Frequency Circuits
6. Characterization of the Behavior of Radiofrequency Power Transistors under Thermal and Electromagnetic Stresses
7. Characterization of the Ability of Switching Transistors to Resist to Electrical Overstress
8. Spectroscopy of Non-destructive Characterizations of the Interface Physics of Mechatronics Devices
9. Study of the Dynamic Contact between Deformable Solids
El Hami, Abdelkhalak
Abdelkhalak El Hami is Professeur des universités at the Institut National des Sciences Appliquées (INSA-Rouen) in France and is in charge of the Normandy Conservatoire National des Arts et Metiers (CNAM) Chair of Mechanics and Head of the department of mechanical engineering of INSA Normandy, as well as several European pedagogical projects. He is an expert in fluid-structure interaction studies, reliability and optimization.

Pougnet, Philippe
Expert in reliability and product-process technology at Valeo, Philippe Pougnet is a doctor-engineer of the Scientific and Medical University of Grenoble and an INPG engineer. He is responsible for the management of the reliability of mechatronic systems manufactured in mass production.