---

PART I. GENERAL
Microstructure and Properties of Engineering Materials
Internal Stresses in Engineering Materials
Texture and Texture Analysis in Engineering Materials
Physical Properties of Photons and Neutrons
Radiation Sources
PART II. METHODS
Introduction to Diffraction Methods for Internal Stress Analyses
Stress Analysis by Angle-Dispersive Neutron Diffraction
Stress Analysis by Energy-Dispersive Neutron Diffraction
Residual Stress Analysis by Monochromatic High-Energy X-rays
Residual Stress Analysis by White High Energy X-Rays
Diffraction Imaging for Microstructure Analysis
Basics of Small-Angle Scattering Methods
Small-Angle Neutron Scattering
Decomposition Kinetics in Copper-Cobalt Alloy Systems: Applications of Small-Angle X-ray Scattering
B3 Imaging
Neutron and Synchrotron-Radiation-Based Imaging for Applications in Materials Science - From Macro- to Nanotomography
Micro-Tomography of Engineering Materials
Diffraction Enhanced Imaging
PART III. NEW AND EMERGING METHODS
3D X-ray Diffraction Microscope
3D Micron-Resolution Laue Diffraction
Quantitative Analysis of Three-Dimensional Plastic Strain Fields Using Markers and X-ray Absorption Tomography
Research with Neutron and Synchrotron Radiation on Aerospace and Automotive Materials and Components
In Situ Experiments with Synchrotron High-Energy X-Rays and Neutrons
Application of Photons and Neutrons for the Characterization and Development of Advanced Steels Contribution of High-Energy X-Rays and Neutrons to Characterization and Development of Intermetallic Titanium Aluminides
In Situ micro-Laue: Instrumental Setup for the Deformation of Micron Sized Samples
Multilayer Systems for Cutting Tools

---

Retaining its proven concept, the second edition of this ready reference specifically addresses the need of materials engineers for reliable, detailed information on modern material characterization methods.
As such, it provides a systematic overview of the increasingly important field of characterization of engineering materials with the help of neutrons and synchrotron radiation. The first part introduces readers to the fundamentals of structure-property relationships in materials and the radiation sources suitable for materials characterization.
The second part then focuses on such characterization techniques as diffraction and scattering methods, as well as direct imaging and tomography. The third part presents new and emerging methods of materials characterization in the field of 3D characterization techniques like three-dimensional X-ray diffraction microscopy. The fourth and final part is a collection of examples that demonstrate the application of the methods introduced in the first parts to problems in materials science.
With thoroughly revised and updated chapters and now containing about 20%
new material, this is the must-have, in-depth resource on this highly relevant topic.

---