---

In the book the author develops new parametric equations for crystal orientation whose solutions are free of constraints or approximations and are well suited for determination of crystal orientation with high accuracy and precision. The results were validated and checked for orienting of single crystals, Silicon wafers, and thin films. Many results shown in the book were discussed in international conferences such as Annual Denver X-ray Conference, or in scientific journals like J. Appl. Crystallography and Acta Crystallographica. The book offers an original work with details on key elements of the derivations of the formulas. In addition, each chapter is accompanied by interesting problems that addresses actual solutions for science and technology. This book is enthusiastically recommended to all diffractionists, professors, physicists, researchers, engineers, technologists and students, who work in Academia as well as Industry.

---