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Emil Zolotoyabko

Basic Concepts of X-Ray Diffraction


1. Auflage. 2014. 312 S. 20 SW-Abb., 120 Farbabb. 244 mm
Verlag/Jahr: WILEY-VCH 2014
ISBN: 3-527-33561-7 (3527335617)
Neue ISBN: 978-3-527-33561-9 (9783527335619)

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Dieses Lehrbuch eines erfahrenen Universitätsdozenten gibt Antworten auf die Fragen, die Studierende wirklich stellen. Klare Illustrationen, eine klare Sprache und klar gegliederte, kurze Kapitel lassen keine Verständnisprobleme aufkommen.
Preface
Introduction
DIFFRACTION PHENOMENA IN OPTICS
WAVE PROPAGATION IN PERIODIC MEDIA
DYNAMICAL DIFFRACTION OF PARTICLES AND FIELDS: GENERAL CONSIDERATIONS
The Two-Beam Approximation
Diffraction Profile: The Laue Scattering Geometry
Diffraction Profile: The Bragg Scattering Geometry
DYNAMICAL X-RAY DIFFRACTION: THE EWALD-LAUE APPROACH
Dynamical X-Ray Diffraction: Two-Beam Approximation
DYNAMICAL DIFFRACTION: THE DARWIN APPROACH
Scattering by a Single Electron
Atomic Scattering Factor
Structure Factor
Scattering Amplitude from an Individual Atomic Plane
Diffraction Intensity inthe Bragg Scattering Geometry
DYNAMICAL DIFFRACTION IN NONHOMOGENEOUS MEDIA. THE TAKAGI-TAUPIN APPROACH
Takagi Equations
Taupin Equation
X-RAY ABSORPTION
DYNAMICAL DIFFRACTION IN SINGLE-SCATTERING APPROXIMATION: SIMULATION OF HIGH-RESOLUTION X-RAY DIFFRACTION IN HETEROSTRUCTURES AND MULTILAYERS
Direct Wave Summation Method
RECIPROCAL SPACE MAPPING AND STRAIN MEASUREMENTS IN HETEROSTRUCTURES
X-RAY DIFFRACTION IN KINEMATIC APPROXIMATION
X-Ray Polarization Factor
Debye-Waller Factor
X-RAY DIFFRACTION FROM POLYCRYSTALLINE MATERIALS
Ideal Mosaic Crystal
Powder Diffraction
APPLICATIONS TO MATERIALS SCIENCE: STRUCTURE ANALYSIS
APPLICATIONS TO MATERIALS SCIENCE: PHASE ANALYSIS
Internal Standard Method
Rietveld Refinement
APPLICATIONS TO MATERIALS SCIENCE: PREFERRED ORIENTATION (TEXTURE) ANALYSIS
The March-Dollase Approach
APPLICATIONS TO MATERIALS SCIENCE: LINE BROADENING ANALYSIS
Line Broadening due to Finite Crystallite Size
Line Broadening due to Microstrain Fluctuations
Williamson-Hall Method
The Convolution Approach
Instrumental Broadening
Relation between Grain Size-Induced and Microstrain-Induced Broadenings of X-Ray Diffraction Profiles
APPLICATIONS TO MATERIALS SCIENCE: RESIDUAL STRAIN/STRESS MEASUREMENTS
Strain Measurements in Single-Crystalline Systems
Residual Stress Measurements in Polycrystalline Materials
IMPACT OF LATTICE DEFECTS ON X-RAY DIFFRACTION
X-RAY DIFFRACTION MEASUREMENTS IN POLYCRYSTALS WITH HIGH SPATIAL RESOLUTION
The Theory of Energy-Variable Diffraction (EVD)
INELASTIC SCATTERING
Inelastic Neutron Scattering
Inelastic X-Ray Scattering
INTERACTION OF X-RAYS WITH ACOUSTIC WAVES
Thermal Diffuse Scattering
Coherent Scattering by Externally Excited Phonons
TIME-RESOLVED X-RAY DIFFRACTION
X-RAY SOURCES
Synchrotron Radiation
X-RAY FOCUSING OPTICSX-Ray Focusing: Geometrical Optics Approach
X-Ray Focusing: Diffraction Optics Approach
X-RAY DIFFRACTOMETERS
High-Resolution Diffractometers
Powder Diffractometers
Index
Authored by an experienced university teacher and based on his lectures, this textbook answers the questions students really ask. Numerous clear-cut illustrations, an easy-to-read style of writing, as well as short, easily digestible chapters all facilitate comprehension.